Optima Research Home Page Illumination & Stray Light Analysis Using ZEMAX  
Illumination and Stray Light Analysis Using ZEMAX: A five-day course
 

Overview

Optical Design Using ZEMAX

Advanced Optical Design Using ZEMAX

Illumination & Stray Light Analysis Using ZEMAX

Programming ZEMAX

Essential Skills for Optical Design

Designing Manufacturable Optical Systems

Optics of Digital Projectors

Applied Digital Projector Design Using ZEMAX

Timetable & Fees

Lecturers & Locations

Registration
Form

Private Training Courses

Who should attend: Optical engineers who wish to learn more about modeling illumination systems and performing stray light analysis with ZEMAX.

The course covers non-sequential ray tracing, sources, detectors, objects, ray splitting, scattering, ghost analysis, stray light analysis, prisms, Fresnel lenses, multi-element lenses, gradient index, polarization and thin film modeling.

Pre-requisites: We assume some knowledge of the sequential ZEMAX user interface for this class since some exercises start in sequential and move to Non-Sequential ZEMAX. However you do not need any prior knowledge of illumination system design or stray light analysis to benefit from this class.

If your designs involve mixed sequential/non-sequential ray-tracing, please note that sequential ray-tracing is not covered in this class. You should consider also taking Optical Design Using ZEMAX if you are not familar with sequential ray-tracing.

Introduction
  • Glass properties and selection
  • Snell’s Law, refraction, reflection
  • Total Internal Reflection (TIR)
  • Non-Sequential ray tracing
  • Three modes of using ZEMAX
  • Sources, Objects, Detectors
  • Object types and definitions
  • Object placement rules
  • Radiometric and Photometric units
Sources
  • Defining and placing sources
  • DLL defined sources
  • File defined sources
  • Radiant SourceTM models
  • Slides
Objects
  • Primitive objects
  • Prisms
  • Fresnel and faceted objects
  • Beam splitters
  • Defining arbitrary objects
  • Complex objects
  • Nesting objects
  • Detectors
  • Objects as detectors
Advanced features
  • Polarization and thin films
  • Scattering theory and models
  • Ray splitting
  • Scatter towards
  • Consider objects list
  • Coating and scatter groups
  • Profiles
  • Bulk scatter
  • Coherence length
  • Diffraction
  • Gradient index media
NSC analysis
  • Beam splitters
  • Stray light analysis
  • Reducing stray light using baffles
  • Sequential ghost analysis
  • Non-sequential ghost analysis
  • Ghost optimization
  • Using slides
  • Interference and interferometers
Stray light analysis
  • Beam splitters
  • Reducing stray light using baffles
  • Ray database
  • Filter strings
  • Saving ray data
  • Database operations
Ghost analysis
  • Sequential ghost analysis
  • Non-sequential ghost analysis
  • Ghost optimization
Interference and interferometers
  • Coherence and fringes
  • Mach Zehnder
Automating data collection
  • Overview
  • ZEMAX Programming Language Macros
  • Universal plot
Illumination system examples
  • Kohler illumination
  • Abbe illumination system
  • Lightpipes
  • Condenser optics
  • Multiple aperture telescopes
Extending analysis
  • User defined sources
  • User defined GRINS
  • User defined diffraction
  • User defined scattering
  • User defined surfaces
  • CAD Import/Export
Course Instructors

Neil Barrett is General Manager of Optima Research.

Michael Johnson is Optical Engineer at Optima Research.


Optima Research Ltd, 8 Riverside Business Park, Stoney Common Road,
Stansted, CM24 8PL, United Kingdom
Tel: +44 (0)1279 810911 Fax: +44 (0)1279 810912

E-mail: info@optima-research.com
Registered in the UK, Registration Number 2819333