Analysis
is one of the most important capabilities an optical design program
can provide. ZEMAX supports a wide variety of analysis tools,
each with a myriad of options to customise the calculations for
maximum flexibility. Extensive defaults are used by the software
to provide useful data quickly, and all defaults may be modified
for user preference. Text output can be produced for all analyses,
to allow data to be exported to other programs if required.
Here
is a partial listing of the most commonly used ZEMAX analysis
tools:
Layouts
 |
2D cross section |
 |
3D perspective with rotation |
 |
Wireframe 3D with rotation, pan,
zoom |
 |
Solid model (hidden Line) with rotation,
pan, zoom |
 |
Singlet and doublet element engineering
drawing |
 |
ISO 10110 format drawings |
Three
dimensional solid modelling
Fans
 |
Ray
aberration |
 |
Optical
path difference |
 |
Pupil
aberration |
A
ray fan diagram showing aberrations by wavelength and field position
Spot Diagrams
 |
Standard
field-by-field |
 |
Through
focus |
 |
Full
field (all at common scale) |
Spot
sizes shown by wavelength and field angle
Diffraction Analysis
 |
Modulation transfer function (MTF),
including phase |
 |
Square wave MTF |
 |
Through focus MTF (sine or square)
|
 |
Point spread function |
 |
Surface 3D MTF |
 |
Geometric transfer function (GTF)
|
 |
Through focus MTF |
 |
Wavefront map surface plot |
Modulation
transfer function compared to the diffraction limit
Encircled Energy
 |
Diffraction
radial |
 |
Geometric
radial, x, y |
 |
Extended
sources |
 |
Line
and Edge response |
Encircled
energy compared to the diffraction limited spot
Image Analysis
 |
Geometric
Image Analysis |
 |
Diffraction
Image Analysis |
 |
Relative
Illumination |
 |
Illumination
X-Y |
 |
Illumination
Scan |

This
plot shows the x-scan illumination profile of a structured light
source
Miscellaneous
 |
Field
curvature and distortion |
 |
RMS
vs. field |
 |
Image
analysis (extended source imaging capability) |
 |
Interferograms
|
 |
Y-Ybar
diagram |
 |
Chromatic
focal shift |
 |
Vignetting
plot |
 |
Dispersion
plot, glass map diagrams |

Simulation
of interferometer output
Polarisation Ray-Tracing
 |
Polarisation
state evolution |
 |
Polarisation
ellipse pupil map |
 |
System
transmission |
 |
Coating
reflection, transmission and absorption |
 |
Polarisation
aberrations |
 |
System
transmission fans |

A
strongly aspheric aluminium mirror causes polarisation aberrations
(below) and a spatially-varying rotation of the polarisation vector
(above)

Numerical Computations
 |
First
order system data |
 |
Surface
power, volume, edge thickness data |
 |
Ray
trace data, real and paraxial |
 |
Fibre
Coupling Efficiency |
 |
Transmission
(including Fresnel reflections, anti-reflection coatings,
glass transmission, vignetting etc) |
 |
Gaussian
beam parameters |
 |
Seidel
and Zernike aberrations |
 |
Wavefront,
transverse, and longitudinal aberrations |
 |
YNI
contributions |
 |
Sag
tables, maximum aspheric deviation |
Remember, this is not a complete list!
Many
of these analysis features can present data as either a graphic
display or a text listing of data. All have extensive options
which can be set to customise the method of calculation or presentation.
The data from each analysis feature is displayed in a separate
independent window, and multiple windows may be opened simultaneously
for comparison.